Chinese Physics C > 2005, Vol. 29 > Issue(5): 517-523

Analysis and Calculation on Electron Bunch Length Measurementby Using CDR

Shanghai Institute of Applied Physics,Shanghai 201800,China

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Abstract：
Measurement of electron bunch length through its generated coherent diffraction radiation (CDR) via optical autocorrelation is a new non-intercepting frequency domain diagnostics technique developed in accelerator fields recently. In this paper, the CDR emitted by femto-second electron bunches provided by the SINAP linac are analyzed and numerically calculated, experimental designs on CDR generation and bunch length measurement are presented, and the beam splitter affected interferogram is simulated. As a result, broad band continuous and high intensity CDR covering a range from far-infrared to mm-wave region can be obtained by directly using these bunches. CDR energy is mainly concentrated near the beam axis and can be up to several millijoules for Gaussian bunches. We use a far-infrared Michelson interferometer and a Golay detector to measure the autocorrelation interferogram of CDR, considering the interference effects caused by the beam splitter, the electron bunch length can be easily obtained, from which one can derive its electron density distribution.

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LIU Ai-Qin, LOU Zheng-Ping, CHEN You-Zhong, ZHOU Wei-Min and Dai Zhi-Min. Analysis and Calculation on Electron Bunch Length Measurementby Using CDR[J]. Chinese Physics C, 2005, 29(5): 517-523.

LIU Ai-Qin, LOU Zheng-Ping, CHEN You-Zhong, ZHOU Wei-Min and Dai Zhi-Min. Analysis and Calculation on Electron Bunch Length Measurementby Using CDR[J]. Chinese Physics C, 2005, 29(5): 517-523. shu

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Received: 2004-09-29
Revised: 2004-11-27

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通讯作者:陈斌, bchen63@163.com

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沈阳化工大学材料科学与工程学院沈阳 110142

Analysis and Calculation on Electron Bunch Length Measurementby Using CDR

Corresponding author:LIU Ai-Qin,

Shanghai Institute of Applied Physics,Shanghai 201800,China

Received Date:2004-09-29

Accepted Date:2004-11-27

Available Online:2005-05-05

Abstract:Measurement of electron bunch length through its generated coherent diffraction radiation (CDR) via optical autocorrelation is a new non-intercepting frequency domain diagnostics technique developed in accelerator fields recently. In this paper, the CDR emitted by femto-second electron bunches provided by the SINAP linac are analyzed and numerically calculated, experimental designs on CDR generation and bunch length measurement are presented, and the beam splitter affected interferogram is simulated. As a result, broad band continuous and high intensity CDR covering a range from far-infrared to mm-wave region can be obtained by directly using these bunches. CDR energy is mainly concentrated near the beam axis and can be up to several millijoules for Gaussian bunches. We use a far-infrared Michelson interferometer and a Golay detector to measure the autocorrelation interferogram of CDR, considering the interference effects caused by the beam splitter, the electron bunch length can be easily obtained, from which one can derive its electron density distribution.

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Analysis and Calculation on Electron Bunch Length Measurementby Using CDR

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