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WANG Lu,CHAI Pei,WU Li-Wei,YUN Ming-Kai,ZHOU Xiao-Lin,LIU Shuang-Quan,ZHANG Yu-Bao,SHAN Bao-Ci,WEI Long. Attenuation correction for dedicated breast PET using only emission data based on consistency conditions. Chinese Physics C, 2013, 37(1): 018201.doi:10.1088/1674-1137/37/1/018201 |
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GAO Juan,CHAI Pei,YUN Ming-Kai,LIU Shuang-Quan,SHAN Bao-Ci,WEI Long. Respiratory motion correction with an improved demons algorithm for PET images. Chinese Physics C, 2012, 36(10): 1025-1030.doi:10.1088/1674-1137/36/10/020 |
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YE Ting,CHAI Pei,GAO Juan,YUN Ming-Kai,LIU Shuang-Quan,SHAN Bao-Ci,WEI Long. Investigation of scatter from out of the field of view and multiple scatter in PET using Monte Carlo simulations. Chinese Physics C, 2011, 35(12): 1166-1171.doi:10.1088/1674-1137/35/12/017 |
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ZHAO Zhi-Ming,WANG Zhi-Guang,SONG Yin,JIN Yun-Fan,SUN You-Mei. FTIR Study of C-Implanted SiO2 after High-Energy Pb-ion Irradiation. Chinese Physics C, 2005, 29(8): 824-829. |
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YANG Zhi-Hu,XIAO Guo-Qing,CHEN Xi-Meng,ZHANG Yan-Ping,ZHAO Yong-Tao,ZHANG Xiao-An,SU Hong,CUI Yin,ZHANG Hong-Qiang,XU Xu,SHAO Jian-Xiong. X-Ray in Highly Charged Ar17+Ion Interacting with Mo Surface. Chinese Physics C, 2004, 28(11): 1231-1233. |
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ZHENG Lei,CUI Ming-Qi,ZHU Jie,ZHAO Yi-Dong. Determination of the Photoabsorption Cross-Sections of Al and Fe Films in the Soft X-Ray Region Using Synchrotron Radiation. Chinese Physics C, 2004, 28(10): 1121-1125. |
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WANG Zhen-Xia,YU Li-Ping,ZHANG Wei,MA Yu-Gang,ZHU Zhi-Yuan,HE Guo-Wei,HU Gang,CHEN Yi. Nanoscale Ar-Bubbles Formed by Ions Irradiating Graphite. Chinese Physics C, 2002, 26(12): 1316-1319. |
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Zhu Zhiyong,Hou Mingdong,Jin Yunfan,Li Changlin,Liu Changlong,Zhang Chonghong,Sun Youmei. Study of Defects in Silicon Irradiated With High Energy Ar Ions. Chinese Physics C, 1999, 23(12): 1248-1252. |
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Liu Changlong,Hou Mingdong,Cheng Song,Zhu Zhiyong,Wang Zhiguang,Sun Youmei,Jin Yunfan,Li Changlin. EPR Studies on Defect Production and lts Annealing Behavior in Silicon After High Fluence Ar lon lrradiation. Chinese Physics C, 1998, 22(7): 651-657. |
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