Chinese Physics C > 2000, Vol. 24 > Issue(6): 578-584

Self-calibration of Silicon Photodiode in the Soft X Ray Spectral Range

Institute of High Energy Physics, The Chinese Academy of Sciences, Beijing 100039,China

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Abstract：
Self-calibration experiment of silicon photodiodes in the soft X-ray spectral region of synchrotron radiation (50—2000eV) is carried out. Because of elimination of “dead region” and adoption of very thin SiO ₂layer as window of the silicon photodiode, a simple model can be used to analyze the process. Based on parameters measured by experiment, the quantum efficiency of the silicon photodiode is calculated, and the flux of incident synchrotron radiation is also obtained.

References

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ZHANG DongQing, CUI MingQi, ZHU PeiPing, ZHAO YiDong and CUI CongWu. Self-calibration of Silicon Photodiode in the Soft X Ray Spectral Range[J]. Chinese Physics C, 2000, 24(6): 578-584.

ZHANG DongQing, CUI MingQi, ZHU PeiPing, ZHAO YiDong and CUI CongWu. Self-calibration of Silicon Photodiode in the Soft X Ray Spectral Range[J]. Chinese Physics C, 2000, 24(6): 578-584. shu

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Received: 1999-04-07
Revised: 1900-01-01

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通讯作者:陈斌, bchen63@163.com

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沈阳化工大学材料科学与工程学院沈阳 110142

Self-calibration of Silicon Photodiode in the Soft X Ray Spectral Range

Corresponding author:ZHANG DongQing,

Institute of High Energy Physics, The Chinese Academy of Sciences, Beijing 100039,China

Received Date:1999-04-07

Accepted Date:1900-01-01

Available Online:2000-06-05

Abstract:Self-calibration experiment of silicon photodiodes in the soft X-ray spectral region of synchrotron radiation (50—2000eV) is carried out. Because of elimination of “dead region” and adoption of very thin SiO₂layer as window of the silicon photodiode, a simple model can be used to analyze the process. Based on parameters measured by experiment, the quantum efficiency of the silicon photodiode is calculated, and the flux of incident synchrotron radiation is also obtained.

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Self-calibration of Silicon Photodiode in the Soft X Ray Spectral Range

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