Chinese Physics C > 2004, Vol. 28 > Issue(7): 781-785

Strong Electronic Excitation Effect of Swift Heavy Ions on C₆₀Films

Institute of Modern Physics,The Chinese Academy of Sciences,Lanzhou 730000,China2 School of Physical Science and Technology,Lanzhou University,Lanzhou 730000,China

Abstract
HTML
Reference
Related

PDF

Abstract：
Strong electronic excitation effect of C ₆₀films induced by 2.0 GeV ¹³⁶Xe and 2.7GeV ²³⁸U ions was investigated by means of Fourier transform infrared (FTIR), Raman Scattering and X-ray diffraction (XRD) spectroscopies. A new peak located at 670 cm ^－1, which corresponds to an unknown structure, was observed in the FTIR spectra of C ₆₀films irradiated for the first time. The variation in intensity of 670 cm ^－1peak with electronic energy loss and irradiation dose were studied. The analysis results indicated that electronic energy transfer dominates the damage process of C ₆₀films. The partial recovery of the damage in irradiated C ₆₀films at middle electronic energy loss is attributed to an annealing effect of the strong electronic excitation. The ion velocity also plays a role in the process of the damage creation.

References

[1]

. Hoffman A, Paterson P J K, Johnston S T et al . Phys. Rev. , 1996,B53( 3) : 15732. Fink D, Klett R, Szimkoviak P et al . Nucl . Instr. Meth. , 1996,B108: 1143. Papal!o R M, Hall!n A, Eriksson J et al . Nucl . Instr. Meth. , 1994,B91: 1244. LeBrum T, Berry H G, Cheng S et al. Phys. Rev. Lett. , 1994, 72:39655. Brinkmalm G, Barofsky D, Demirev P et al. Chem. Phys. Lett. , 1992,191: 3456. JIN Y F, TIAN H X, XIE E Q et al. Nucl. Instr. Meth. , 2002, B193:2887. Kastner J, Kuzmany H, Palmetshofer L. Appl. Phys. Lett . , 1994, 65:5438. Zawislak F C, Baptist a D L, Behar M. Nucl. Instr. Meth. , 1999,B149: 3369. Audouard A, Balanzat E, Bouffard S et al . Phys. Rev. Lett . , 1990, 65( 7) : 87510. Balanzat E, Betz N, Bouff art S. Nucl. Inst r. Meth, 1995, B105: 4611. RAO A M, ZHOU P, WANG K A et al. Science, 1993, 259: 95512. Sauvajol J L, Brocarc F, Hricha Z et al. Phys. Rev. , 1995, B52:1438913. Dresselhaus M S, Dresselhaus G, Eklund P C. Science of Fullerenesand Carbon Nanotubes. San Diego: Academic Press, 199614. Toulemonde M, Dufour C, Paumier E. Phys. Rev. , 1992, B46:1436215. Ziegler J F, Biersack J P, Littmark U. The St opping and Ranges of Ionsin Solids. New York: Pergamon Press, 198516. JIN Y F, YANG R, WANG Y B et al . Nucl . Instr. Meth. , 2000,B164 .. 165: 39117. Iwase A, Sasaki S, Iwata T et al. Phys. Rev. Lett . , 1987, 58( 23) :245018. WANG Z G, Dufour C, Cabeau B et al. Nucl. Instr. Meth. , 1996,B107: 17519. Meftah A, Brisard F, Costantini J M et al . Phys. Rev. , 1993, B48:920

Access

Get Citation

JIN Yun-Fan, TIAN Hui-Xian, LIU Jie, XIE Er-Qing, WANG Zhi-Guang, ZHANG Chong-Hong, SUN You-Mei, ZHU Zhi-Yong and YAO Cun-Feng. Strong Electronic Excitation Effect of Swift Heavy Ions on C ₆₀Films[J]. Chinese Physics C, 2004, 28(7): 781-785.

RIS(for EndNote,Reference Manager,ProCite)

BibTex

Txt

Milestone

Received: 2003-08-21
Revised: 1900-01-01

Article Metric

Article Views(4001)
PDF Downloads(434)
Cited by(0)

Policy on re-use

To reuse of subscription content published by CPC, the users need to request permission from CPC, unless the content was published under an Open Access license which automatically permits that type of reuse.

通讯作者:陈斌, bchen63@163.com

1.
沈阳化工大学材料科学与工程学院沈阳 110142

Strong Electronic Excitation Effect of Swift Heavy Ions on C₆₀Films

Corresponding author:JIN Yun-Fan,

Institute of Modern Physics,The Chinese Academy of Sciences,Lanzhou 730000,China2 School of Physical Science and Technology,Lanzhou University,Lanzhou 730000,China

Received Date:2003-08-21
Accepted Date:1900-01-01
Available Online:2004-07-05

Abstract:Strong electronic excitation effect of C₆₀films induced by 2.0 GeV¹³⁶Xe and 2.7GeV²³⁸U ions was investigated by means of Fourier transform infrared (FTIR), Raman Scattering and X-ray diffraction (XRD) spectroscopies. A new peak located at 670 cm^－1, which corresponds to an unknown structure, was observed in the FTIR spectra of C₆₀films irradiated for the first time. The variation in intensity of 670 cm^－1peak with electronic energy loss and irradiation dose were studied. The analysis results indicated that electronic energy transfer dominates the damage process of C₆₀films. The partial recovery of the damage in irradiated C₆₀films at middle electronic energy loss is attributed to an annealing effect of the strong electronic excitation. The ion velocity also plays a role in the process of the damage creation.