Chinese Physics C > 2002, Vol. 26 > Issue(11): 1184-1188

Emittance Measurement by Multi-Changing Focusing Strength

Institute of High Energy Physics, The Chinese Academy of Sciences, Beijing 100039, China

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Abstract：
Some advanced techniques to optimize the emittance measurement devices have been studied, such as thin lens approximation, multi changing focusing strength, optimizing the position of the profile monitor and software improvement for accurate data acquisition and effective processing. By applying these techniques to the emittance measurement for electron beam of BEPC Linac, the satisfactory measurement results have been obtained.

References

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WANG Shu-Hong, YE Qiang, CAO Jian-She, MA Li, LIU Yu-Cheng, LE Qi, PEI Guo-Xi and ZHANG Jia-Fei. Emittance Measurement by Multi-Changing Focusing Strength[J]. Chinese Physics C, 2002, 26(11): 1184-1188.

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Received: 2002-01-22
Revised: 1900-01-01

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1.
沈阳化工大学材料科学与工程学院沈阳 110142

Emittance Measurement by Multi-Changing Focusing Strength

Corresponding author:WANG Shu-Hong,

Institute of High Energy Physics, The Chinese Academy of Sciences, Beijing 100039, China

Received Date:2002-01-22
Accepted Date:1900-01-01
Available Online:2002-11-05

Abstract:Some advanced techniques to optimize the emittance measurement devices have been studied, such as thin lens approximation, multi changing focusing strength, optimizing the position of the profile monitor and software improvement for accurate data acquisition and effective processing. By applying these techniques to the emittance measurement for electron beam of BEPC Linac, the satisfactory measurement results have been obtained.