Chinese Physics C > 1995, Vol. 19 > Issue(5): 473-478

Application of BSRF X-Ray Diffraction Station to Researches in Material Science

Wang Dewu^,,
Liu Jianfei

Institute of High Energy Physics, Academia Sinica, Beijing 100039

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Abstract：
This paper describes experimental apparatus and performance of the X-ray diffraction station at Beijing Synchrotron Radiation Facility (BSKF). Using a SR source of BEPC and the X-ray diffractometer, the study of multilayers and semiconductor superlattice structure, as well as the measurements of residual stress relaxation anddistribution around the ceramic-metal (Si ₃N ₄/Steel) interface have been developed.

References

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Wang Dewu and Liu Jianfei. Application of BSRF X-Ray Diffraction Station to Researches in Material Science[J]. Chinese Physics C, 1995, 19(5): 473-478.

Wang Dewu and Liu Jianfei. Application of BSRF X-Ray Diffraction Station to Researches in Material Science[J]. Chinese Physics C, 1995, 19(5): 473-478. shu

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Received: 1900-01-01
Revised: 1900-01-01

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沈阳化工大学材料科学与工程学院沈阳 110142

Application of BSRF X-Ray Diffraction Station to Researches in Material Science

Wang Dewu^,
Liu Jianfei

Corresponding author:Wang Dewu,

Institute of High Energy Physics, Academia Sinica, Beijing 100039

Received Date:1900-01-01
Accepted Date:1900-01-01
Available Online:1995-05-05

Abstract:This paper describes experimental apparatus and performance of the X-ray diffraction station at Beijing Synchrotron Radiation Facility (BSKF). Using a SR source of BEPC and the X-ray diffractometer, the study of multilayers and semiconductor superlattice structure, as well as the measurements of residual stress relaxation anddistribution around the ceramic-metal (Si₃N₄/Steel) interface have been developed.