Chinese Physics C > 2010, Vol. 34 > Issue(12): 1895-1899

Employing a Cerenkov detector for the thickness measurement of X-rays in a scattering background

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Abstract：

The variation in environmental scattering background is a major source of systematic errors in X-ray inspection and measurement systems. As the energy of these photons consisting of environmental scattering background is much lower generally, the Cerenkov detectors having the detection threshold are likely insensitive to them and able to exclude their influence. A thickness measurement experiment is designed to verify the idea by employing a Cerenkov detector and an ionizing chamber for comparison. Furthermore, it is also found that the application of the Cerenkov detectors is helpful to exclude another systematic error from the variation of low energy components in the spectrum incident on the detector volume.

References

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LI Shu-Wei, KANG Ke-Jun, WANG Yi, LI Jin, LI Yuan-Jing and ZHANG Qing-Jun. Employing a Cerenkov detector for the thickness measurement of X-rays in a scattering background[J]. Chinese Physics C, 2010, 34(12): 1895-1899.

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Received: 2010-01-19
Revised: 2010-04-27

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通讯作者:陈斌, bchen63@163.com

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沈阳化工大学材料科学与工程学院沈阳 110142

Employing a Cerenkov detector for the thickness measurement of X-rays in a scattering background

Corresponding author:LI Shu-Wei,

Received Date:2010-01-19

Accepted Date:2010-04-27

Available Online:2010-12-05

Abstract:

The variation in environmental scattering background is a major source of systematic errors in X-ray inspection and measurement systems. As the energy of these photons consisting of environmental scattering background is much lower generally, the Cerenkov detectors having the detection threshold are likely insensitive to them and able to exclude their influence. A thickness measurement experiment is designed to verify the idea by employing a Cerenkov detector and an ionizing chamber for comparison. Furthermore, it is also found that the application of the Cerenkov detectors is helpful to exclude another systematic error from the variation of low energy components in the spectrum incident on the detector volume.

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Employing a Cerenkov detector for the thickness measurement of X-rays in a scattering background

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通讯作者:陈斌, bchen63@163.com

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