Chinese Physics C > 2015, Vol. 39 > Issue(5): 056201 DOI: 10.1088/1674-1137/39/5/056201

A precise calculation of delayed coincidence selection efficiency and accidental coincidence rate

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Abstract：
A precise background evaluation model is proposed to address the complex data structure of the delayed coincidence method, which is widely used in reactor electron-antineutrino oscillation experiments. In this model, effects from the muon veto, uncorrelated random background, and background are all studied analytically, simplifying the estimation of the systematic uncertainties of signal efficiency and accidental background rate. The results of the calculations are validated numerically with a number of simulation studies and also applied and validated in the recent Daya Bay hydrogen-capture based oscillation measurement.

References

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YU Jing-Yi, WANG Zhe and CHEN Shao-Min. A precise calculation of delayed coincidence selection efficiency and accidental coincidence rate[J]. Chinese Physics C, 2015, 39(5): 056201. doi: 10.1088/1674-1137/39/5/056201

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Received: 2014-09-04
Revised: 2014-11-15

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通讯作者:陈斌, bchen63@163.com

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沈阳化工大学材料科学与工程学院沈阳 110142

A precise calculation of delayed coincidence selection efficiency and accidental coincidence rate

Corresponding author:WANG Zhe,

Received Date:2014-09-04

Accepted Date:2014-11-15

Available Online:2015-05-05

Abstract:A precise background evaluation model is proposed to address the complex data structure of the delayed coincidence method, which is widely used in reactor electron-antineutrino oscillation experiments. In this model, effects from the muon veto, uncorrelated random background, and background are all studied analytically, simplifying the estimation of the systematic uncertainties of signal efficiency and accidental background rate. The results of the calculations are validated numerically with a number of simulation studies and also applied and validated in the recent Daya Bay hydrogen-capture based oscillation measurement.

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A precise calculation of delayed coincidence selection efficiency and accidental coincidence rate

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