Chinese Physics C > 2010, Vol. 34 > Issue(2): 227-230 DOI: 10.1088/1674-1137/34/2/014

Electro-optical sampling non-synchronous delay scanning measurement ofelectron beam bunch length at BFEL

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Abstract：

The Electro-optical sampling delay scanning technique can be used for electron beam bunch length measurement. A novel non-ynchronous delay scanning technique based on the electro-optical sampling measurements is presented. Based on Beijing Free Electron Laser (BFEL), the electron beam bunch length was measured with the electro-optical sampling technique for the first time in China. The result shows that the electron beam bunch length at BFEL is about 5.6±1.2 ps.

References

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SUN Da-Rui, XU Jin-Qiang and CHEN Sen-Yu. Electro-optical sampling non-synchronous delay scanning measurement ofelectron beam bunch length at BFEL[J]. Chinese Physics C, 2010, 34(2): 227-230. doi: 10.1088/1674-1137/34/2/014

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Received: 2009-06-24
Revised: 2009-07-14

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通讯作者:陈斌, bchen63@163.com

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沈阳化工大学材料科学与工程学院沈阳 110142

Electro-optical sampling non-synchronous delay scanning measurement ofelectron beam bunch length at BFEL

Corresponding author:SUN Da-Rui,

Received Date:2009-06-24

Accepted Date:2009-07-14

Available Online:2010-02-05

Abstract:

The Electro-optical sampling delay scanning technique can be used for electron beam bunch length measurement. A novel non-ynchronous delay scanning technique based on the electro-optical sampling measurements is presented. Based on Beijing Free Electron Laser (BFEL), the electron beam bunch length was measured with the electro-optical sampling technique for the first time in China. The result shows that the electron beam bunch length at BFEL is about 5.6±1.2 ps.

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Electro-optical sampling non-synchronous delay scanning measurement ofelectron beam bunch length at BFEL

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通讯作者:陈斌, bchen63@163.com

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