Chinese Physics C > 2010, Vol. 34 > Issue(1): 138-142 DOI: 10.1088/1674-1137/34/1/026

Bunch length measurement using a traveling wave RF deflector

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Abstract：

RF deflectors can be used for bunch length measurement with high resolution. This paper describes a completed S-band traveling wave RF deflector and the bunch length measurement of the electron beam produced by the photocathode RF gun of the Shanghai DUV-FEL facility. This is the first time that such a transverse RF deflector has been developed and used to measure the bunch length of picosecond order in China. The deflector's VSWR is 1.06, the whole attenuation 0.5 dB, and the bandwidth 4.77 MHz for VSWR less than 1.1. With a laser pulse width of 8.5 ps, beam energy of 4.2 MeV, and bunch charge of 0.64 nC, the bunch lengths for different RF input power into the deflector were measured, and an averaged rms bunch length of 5.25 ps was obtained. A YAG crystal is used as a screen downstream of the deflector, with the calibrated value of 1 pix=136 μm.

References

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. Ste en B, Casalbuoni S, Schmuser P et al. Bunch Length Measurements at the SLS Linac using Electro Optical Sam-pling. Proceedings of the 2004 FEL Conference, 392-3942. Graves W S, Carr G L, Di Mauro L F et al. Ultrashort Elec-tron Bunch Length Measurements at SDUVFEL. Proceed-ings of the 2001 Particle Accelerator Conference, Chicago,2006. 22243. Settakorn C, Hernandez M et al. Femtosecond Electron Bunches. SLAC-PUB-7813, May 19984. Akre R, Bentson L et al. Bunch Length Measurementsusing a Transverse RF Deecting Structure in the SLACLINAC, SLAC-PUB-9241, May, 20025. Frohlich L et al. Longitudinal Bunch Shape Diagnostic with Coherent Radiation and a Transverse Deecting Cavity atTTF2, SLAC-PUB-113876. ZHANG Jing-Ru, HOU Mi, DAI Jian-Ping et al. Designand Studies on the Traveling Wave Transverse RF Deect-ing Structure. Chinese Physics C, 2008, 327. Bolzmann A. Investigation of the Longitudinal Charge Dis-tribution of Electron Bunches at the VUV-FEL using the Transverse Deecting Cavity LOLA. DESY-THESIS-2005-046, 2005

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ZHANG Jing-Ru, DAI Jian-Ping, GU Qiang, PEI Guo-Xi, ZHAO Ming-Hua, ZHONG Shao-Peng, WANG Xing-Tao, CHEN Yong-Zhong and HOU Mi. Bunch length measurement using a traveling wave RF deflector[J]. Chinese Physics C, 2010, 34(1): 138-142. doi: 10.1088/1674-1137/34/1/026

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Received: 2009-03-06
Revised: 2009-03-17

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通讯作者:陈斌, bchen63@163.com

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沈阳化工大学材料科学与工程学院沈阳 110142

Bunch length measurement using a traveling wave RF deflector

Corresponding author:ZHANG Jing-Ru,

Received Date:2009-03-06

Accepted Date:2009-03-17

Available Online:2010-01-05

Abstract:

RF deflectors can be used for bunch length measurement with high resolution. This paper describes a completed S-band traveling wave RF deflector and the bunch length measurement of the electron beam produced by the photocathode RF gun of the Shanghai DUV-FEL facility. This is the first time that such a transverse RF deflector has been developed and used to measure the bunch length of picosecond order in China. The deflector's VSWR is 1.06, the whole attenuation 0.5 dB, and the bandwidth 4.77 MHz for VSWR less than 1.1. With a laser pulse width of 8.5 ps, beam energy of 4.2 MeV, and bunch charge of 0.64 nC, the bunch lengths for different RF input power into the deflector were measured, and an averaged rms bunch length of 5.25 ps was obtained. A YAG crystal is used as a screen downstream of the deflector, with the calibrated value of 1 pix=136 μm.

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Bunch length measurement using a traveling wave RF deflector

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通讯作者:陈斌, bchen63@163.com

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