Chinese Physics C > 2008, Vol. 32 > Issue(S1): 68-70

Secondary Electron Yield Studies on Vacuum Materials

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Abstract：
A secondary electron yield test device for vacuum material study is set up, and its detailed design described in this paper. The test results for a few common vacuum materials with and without TiN film coating are presented, and the influential factors on secondary electron yield are analyzed. All the work will be helpful to the surface pretreatment of vacuum materials.

References

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ZHANG Yao-Feng, WANG Yong, WEI Wei, WANG Jian-Ping, FAN Le, GUAN Chang-Ying and LIU Zu-Ping. Secondary Electron Yield Studies on Vacuum Materials[J]. Chinese Physics C, 2008, 32(S1): 68-70.

ZHANG Yao-Feng, WANG Yong, WEI Wei, WANG Jian-Ping, FAN Le, GUAN Chang-Ying and LIU Zu-Ping. Secondary Electron Yield Studies on Vacuum Materials[J]. Chinese Physics C, 2008, 32(S1): 68-70. shu

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Received: 2008-01-10
Revised: 1900-01-01

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沈阳化工大学材料科学与工程学院沈阳 110142

Secondary Electron Yield Studies on Vacuum Materials

Corresponding author:ZHANG Yao-Feng,

Received Date:2008-01-10
Accepted Date:1900-01-01
Available Online:2008-01-04

Abstract:A secondary electron yield test device for vacuum material study is set up, and its detailed design described in this paper. The test results for a few common vacuum materials with and without TiN film coating are presented, and the influential factors on secondary electron yield are analyzed. All the work will be helpful to the surface pretreatment of vacuum materials.