Chinese Physics C > 1998, Vol. 22 > Issue(8): 763-767

Study of X-Ray Interference Using Synchrotron Radiation

Institute of High Energy Physics,The Cinese Academy of Sciences,Beijing1000391 Department of Precision Instruments Tsinghua University Beijing 100084

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Abstract：
The experimentd study of synchrotron radiation X-ray interference has been presented. This experiment has been performed at the topography station of Beijing Synchrotron Radation Facility. The Moire fringes have been observed on the X-ray films. It has laid an initial foundation for the measurements with nm length.

References

[1]	Bonse U, Hart M. Appl. Phys. Lett., 1965, 6:155[2] Bowen D K et al. Meas. Sci. Technol., 1990, 1:107[3] Windsch D et al. J. Appl. Cryst, 1992, 25:377

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Jiang Jianhua, Wang Zhouguang, Tian Yulian, Wang Gongli, Zhao Yang, Cao Mang, Li Dacheng, Study of X-Ray Interference Using Synchrotron Radiation[J]. Chinese Physics C, 1998, 22(8): 763-767.

Jiang Jianhua, Wang Zhouguang, Tian Yulian, Wang Gongli, Zhao Yang, Cao Mang, Li Dacheng, Study of X-Ray Interference Using Synchrotron Radiation[J]. Chinese Physics C, 1998, 22(8): 763-767. shu

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Received: 1900-01-01
Revised: 1900-01-01

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沈阳化工大学材料科学与工程学院沈阳 110142

Study of X-Ray Interference Using Synchrotron Radiation

Corresponding author:Jiang Jianhua,

Institute of High Energy Physics,The Cinese Academy of Sciences,Beijing1000391 Department of Precision Instruments Tsinghua University Beijing 100084

Received Date:1900-01-01
Accepted Date:1900-01-01
Available Online:1998-08-05

Abstract:The experimentd study of synchrotron radiation X-ray interference has been presented. This experiment has been performed at the topography station of Beijing Synchrotron Radation Facility. The Moire fringes have been observed on the X-ray films. It has laid an initial foundation for the measurements with nm length.