Chinese Physics C > 2008, Vol. 32 > Issue(S1): 148-150

Measurement Techniques of High-Current Ion Beam Emittance

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Abstract：
One should pay attention to quite a lot of factors when the emittance of high-current ion beam is measured. The background subtraction and threshold setting, the measuring method of pulsed beam emittance, as well as the error sources in the emittance measurements and its elimination or correction are discussed based on the experience during the R&D of three emittance measurement units for high-current ion beams at Peking University.

References

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GUO Zhi-Yu, XU Rong, MING Jian-Chuan, ZOU Yu-Bin, GAO Shu-Li, ZHAO Jie, PENG Shi-Xiang, WU Wen-Zhog, QIAN Feng, SONG Zhi-Zhong, YU Jin-Xiang, YUAN Zhong-Xi and YU Mao-Lin. Measurement Techniques of High-Current Ion Beam Emittance[J]. Chinese Physics C, 2008, 32(S1): 148-150.

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Received: 2008-01-10
Revised: 1900-01-01

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通讯作者:陈斌, bchen63@163.com

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沈阳化工大学材料科学与工程学院沈阳 110142

Measurement Techniques of High-Current Ion Beam Emittance

Received Date:2008-01-10

Accepted Date:1900-01-01

Available Online:2008-01-04

Abstract:One should pay attention to quite a lot of factors when the emittance of high-current ion beam is measured. The background subtraction and threshold setting, the measuring method of pulsed beam emittance, as well as the error sources in the emittance measurements and its elimination or correction are discussed based on the experience during the R&D of three emittance measurement units for high-current ion beams at Peking University.

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Measurement Techniques of High-Current Ion Beam Emittance

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